McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments
Research output: Contribution to journal › Journal article › Research › peer-review
| Original language | English |
|---|---|
| Journal | Journal of Applied Crystallography |
| Volume | 46 |
| Issue number | Part 3 |
| Pages (from-to) | 679-696 |
| Number of pages | 18 |
| ISSN | 0021-8898 |
| DOIs | |
| Publication status | Published - 1 Jun 2013 |
ID: 57847516