Imaging electromigration during the formation of break junctions.

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  • Nl062631i

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Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
Original languageEnglish
JournalNano Letters
Issue number3
Pages (from-to)652-656
Number of pages5
Publication statusPublished - 1 Jan 2007
Externally publishedYes

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