Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam
Research output: Contribution to journal › Journal article › Research › peer-review
Original language | English |
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Article number | 103101 |
Journal | Applied Physics Letters |
Volume | 107 |
Issue number | 10 |
Number of pages | 5 |
ISSN | 0003-6951 |
DOIs | |
Publication status | Published - 7 Sep 2015 |
ID: 146288265