Integrated SO-MZI for pattern effect free amplification
Research output: Contribution to journal › Journal article › Research › peer-review
Standard
Integrated SO-MZI for pattern effect free amplification. / Patent, Evgeni A; Tol, JJGM van der; Nielsen, Mads Lønstrup; Binsma, JJM; Oei, YS; Mørk, Jesper; Smit, MK.
In: I E E E Electron Device Letters, Vol. 41, No. 4, 2005, p. 51-52.Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Patent, EA, Tol, JJGMVD, Nielsen, ML, Binsma, JJM, Oei, YS, Mørk, J & Smit, MK 2005, 'Integrated SO-MZI for pattern effect free amplification', I E E E Electron Device Letters, vol. 41, no. 4, pp. 51-52.
APA
Patent, E. A., Tol, JJGM. V. D., Nielsen, M. L., Binsma, JJM., Oei, YS., Mørk, J., & Smit, MK. (2005). Integrated SO-MZI for pattern effect free amplification. I E E E Electron Device Letters, 41(4), 51-52.
Vancouver
Patent EA, Tol JJGMVD, Nielsen ML, Binsma JJM, Oei YS, Mørk J et al. Integrated SO-MZI for pattern effect free amplification. I E E E Electron Device Letters. 2005;41(4):51-52.
Author
Bibtex
@article{fd3a1809f156404d83f9a3d051b95ffb,
title = "Integrated SO-MZI for pattern effect free amplification",
author = "Patent, {Evgeni A} and Tol, {JJGM van der} and Nielsen, {Mads L{\o}nstrup} and JJM Binsma and YS Oei and Jesper M{\o}rk and MK Smit",
year = "2005",
language = "English",
volume = "41",
pages = "51--52",
journal = "IEEE Electron Device Letters",
issn = "0741-3106",
publisher = "Institute of Electrical and Electronics Engineers",
number = "4",
}
RIS
TY - JOUR
T1 - Integrated SO-MZI for pattern effect free amplification
AU - Patent, Evgeni A
AU - Tol, JJGM van der
AU - Nielsen, Mads Lønstrup
AU - Binsma, JJM
AU - Oei, YS
AU - Mørk, Jesper
AU - Smit, MK
PY - 2005
Y1 - 2005
M3 - Journal article
VL - 41
SP - 51
EP - 52
JO - IEEE Electron Device Letters
JF - IEEE Electron Device Letters
SN - 0741-3106
IS - 4
ER -
ID: 108652992