From ballistic transport to tunneling in electromigrated ferromagnetic breakjunctions.
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From ballistic transport to tunneling in electromigrated ferromagnetic breakjunctions. / Bolotin, Kirill I; Kuemmeth, Ferdinand; Pasupathy, Abhay N; Ralph, D C.
In: Nano Letters, Vol. 6, No. 1, 01.01.2006, p. 123-127.Research output: Contribution to journal › Journal article › peer-review
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TY - JOUR
T1 - From ballistic transport to tunneling in electromigrated ferromagnetic breakjunctions.
AU - Bolotin, Kirill I
AU - Kuemmeth, Ferdinand
AU - Pasupathy, Abhay N
AU - Ralph, D C
PY - 2006/1/1
Y1 - 2006/1/1
N2 - We fabricate ferromagnetic nanowires with constrictions whose cross section can be reduced gradually from 100 x 30 nm(2) to the atomic scale and eventually to the tunneling regime by means of electromigration. The contacts are mechanically and thermally stable. We measure low-temperature magnetoresistances (MR) <3% for contacts <400 Omega, reproducible MR variations that are nonmonotonic in the regime 400 Omega - 25 kOmega, and a maximum MR of 80% for atomic-scale widths. These results for devices > 400 Omega differ from previous room-temperature studies of electrodeposited devices. For samples in the tunneling regime, we observe large fluctuations in MR, between -10 and 85%.
AB - We fabricate ferromagnetic nanowires with constrictions whose cross section can be reduced gradually from 100 x 30 nm(2) to the atomic scale and eventually to the tunneling regime by means of electromigration. The contacts are mechanically and thermally stable. We measure low-temperature magnetoresistances (MR) <3% for contacts <400 Omega, reproducible MR variations that are nonmonotonic in the regime 400 Omega - 25 kOmega, and a maximum MR of 80% for atomic-scale widths. These results for devices > 400 Omega differ from previous room-temperature studies of electrodeposited devices. For samples in the tunneling regime, we observe large fluctuations in MR, between -10 and 85%.
U2 - 10.1021/nl0522936
DO - 10.1021/nl0522936
M3 - Journal article
VL - 6
SP - 123
EP - 127
JO - Nano Letters
JF - Nano Letters
SN - 1530-6984
IS - 1
ER -
ID: 44225683