Yes, one can obtain better quality structures from routine X-ray data collection
Research output: Contribution to journal › Journal article › Research › peer-review
Documents
- Sanjuan_Szklarz_2016_Yes_one_can_obtain
Final published version, 1.05 MB, PDF document
| Original language | English |
|---|---|
| Journal | IUCrJ |
| Volume | 3 |
| Pages (from-to) | 61-70 |
| Number of pages | 10 |
| ISSN | 2052-2525 |
| DOIs | |
| Publication status | Published - 2016 |
- X-ray diffraction results, precision, independent atom model, transferable aspherical atom model, geometric parameters, TLS analysis
Research areas
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ID: 164212057