Measurement of high-quality diffraction data with a Nonius KappaCCD diffractometer: finding the optimal experimental parameters
Research output: Contribution to journal › Journal article › Research › peer-review
| Original language | English |
|---|---|
| Journal | Journal of Applied Crystallography |
| Issue number | 36 |
| Pages (from-to) | 931-939 |
| ISSN | 0021-8898 |
| Publication status | Published - 2003 |
ID: 124819